CT4538 Extended Reach Fine Tip Probes

Cal Test Electronics CT4538 Extended Reach Fine Tip Probes are designed for high-voltage measurement environments that require a long reach, precision contact, and safety. These probes meet IEC 61010-031 standards, carry a 1000V CAT IV rating, and support up to 16A, making them suitable for industrial, field service, and laboratory use. Other features include a sharp stainless steel tip that is built to pierce oxides and maintain reliable contact on various surfaces. Cal Test Electronics CT4538 Extended Reach Fine Tip Probes offer an extended 138mm body that ensures access in hard-to-reach test points, while a clear, removable probe cap provides protection for transport or storage.

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Cal Test Prüfspitzen DMM Probe Body, 1000V CAT IV, 2mm SS Tip, Clear Cap, Black
Datenblatt
34Auf Lager
Min.: 1
Mult.: 1

Probe Tip 138.1 mm 1.5 kVDC 16 A
Cal Test Prüfspitzen DMM Probe Body, 1000V CAT IV, 2mm SS Tip,Clear Cap, Black/Red Pair
Datenblatt
50Auf Lager
Min.: 1
Mult.: 1

Probe Tip 138.1 mm 1.5 kVDC 16 A
Cal Test Prüfspitzen DMM Probe Body, 1000V CAT IV, 2mm SS Tip, Clear Cap, Red
Datenblatt
33Auf Lager
Min.: 1
Mult.: 1

Probe Tip 138.1 mm 1.5 kVDC 16 A